Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder.

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TextSeries: Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006Edition: 1st ed. 2006Description: XXI, 939 p. online resourceContent type:

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Contents:

Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.

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Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.

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