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Static Analysis [electronic resource] : 24th International Symposium, SAS 2017, New York, NY, USA, August 30 – September 1, 2017, Proceedings / edited by Francesco Ranzato.

Contributor(s): Material type: TextSeries: Publisher: Cham : Springer International Publishing : Imprint: Springer, 2017Edition: 1st ed. 2017Description: XIV, 473 p. 114 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783319667065
Subject(s): DDC classification:
  • 004.0151 23
Online resources:
Contents:
Theoretical, practical, and applicational advances in area of static analysis -- Program verification.- Bug detection --  Compiler organization -- Program understanding -- Software maintenance. .
Summary: This book constitutes the refereed proceedings of the 24th International Static Analysis Symposium, SAS 2017, held in New York, NY, USA, in August/September 2017. The 22 papers presented in this volume were carefully reviewed and selected from 50 submissions. The papers cover various aspects of the presentation of theoretical, practical, and applicational advances in area of static analysis that is recognized as a fundamental tool for program verification, bug detection, compiler organization, program understanding, and software maintenance. .
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Theoretical, practical, and applicational advances in area of static analysis -- Program verification.- Bug detection --  Compiler organization -- Program understanding -- Software maintenance. .

This book constitutes the refereed proceedings of the 24th International Static Analysis Symposium, SAS 2017, held in New York, NY, USA, in August/September 2017. The 22 papers presented in this volume were carefully reviewed and selected from 50 submissions. The papers cover various aspects of the presentation of theoretical, practical, and applicational advances in area of static analysis that is recognized as a fundamental tool for program verification, bug detection, compiler organization, program understanding, and software maintenance. .

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