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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

By: Contributor(s): Material type: ArticleSeries: Publication details: KIT Scientific Publishing 2014Description: 1 electronic resource (IX, 126 p. p.)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783731502630
Subject(s): Online resources: Summary: In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm
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In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm

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